X-Ray Diffraction for Materials Research
From Fundamentals to Applications
- Format: Pocket
- Antall sider: 302
- Språk: Engelsk
- Forlag/Utgiver: SD Books
- EAN: 9781774635933
- Utgivelsesår: 2021
- Bidragsyter: Lee, Myeongkyu (Point Pleasant, New Jersey, USA)
X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction.
The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also
¿ provides background knowledge of diffraction to enable nonspeciali